Maggi Loubser, PPC Cement, South Africa
Representative sampling and the errors introduced in sampling and sample preparation
Hege Zahl, on behalf of Elkem Solar Research, Norway
Quality control charting
Rainer Schramm, Fluxana GmbH & Co. KG, Germany
Analysis of ashes with XRF based on fused beads
Kohei Kansai, Rigaku Europe SE, Germany
X-ray fluorescence analysis of rocks by fusion method using a benchtop WD-XRF
Elke Thisted, Elkem Solar Research, Norway
Aging of a Li2B4O7 glass - 5 years of analysis
Routine XRD analysis on anode material - our experience
Elke Schwöbel, Bruker AXS GmbH, Germany
Quantitative XRD-analysis of phases with known, partial or no known crystal structures
Jakob Noreland, PANalytical B.V, Sweden
Using XRD in the hunt for cost and CO2 reductions in the metal and mining industry
Katarzyna Mirek-Sliwa, Darrell Harman, Lorentz Petter Lossius, Hydro Aluminium, Norway/Australia
Advantages in use of the Multivariate Regression (MVR) method in the XRD bath acidity analysis
Stein Rørvik, SINTEF, Norway
A review of problems related to Lc measurements by XRD of carbon materials
V. K. Egorov, E. V. Egorov, Institute of microelectronics technology Russian academy of science, Russia
Waveguide-resonance propagation mechanism for X-ray flux and it's realization conditions
Renaat van Geel, D.Bonvin, Thermo Fisher Scientific, The Netherlands/Switzerland
Concept differences in an XRF goniometer system
Akihiko Iwata, Rigaku Europe SE, Germany
Developement of a high brilliance rotating anode dual-wavelength X-ray generator and multi-layer mirror for dual-wavelength
Lorentz Petter Lossius, Hydro Aluminium, Norway
XRF of Aluminium Fluoride - Interlaboratory Study for ISO Precision
Hege Indresand, Crocker Nuclear Laboratory, University of California Davis, USA
Advanced Reference Materials for XRF Analysis in the US IMPROVE Atmospheric Particulate Matter Network.
M.Haschke, U.Rosseck, R.Tagle, U. Waldschläger and H.Wagenknecht, Bruker Nano GmbH, Germany
Ultra-fast and sensitive element distribution measurement using micro-XRF
Torfinn Fongen, Holger Teknologi, AS, Norway
Uses of portable XRF
Kevin Young, Peter Sheppardson, Sibelco Europe, England
Practical Aspects of the X-ray Characterisation of Silicate and Alumino-silicate Industrial Minerals
P.Lemberge, Renaat van Geel, TermoFisher Scientific, Switzerland
F. Herzog, M.S. Krzemnicki, Swiss Gemmological Institute SSEF, Switzerland
ED-XRF analysis to determine the origin and authenticity of gemstones
Armand Jonkers, PANalytical, The Netherlands
Advances in standardless analysis
Ingvar Bernhardsson, D-LAB, Sweden
Multi base, multi range calibration
Dirk Wissmann, SPECTRO Analytical Instruments GmbH, Germany
XRF-Calculation of results empirical, semi-empirical, fundamental parameters - versatility vs. precision vs accuracy