Meny
16 April 2018

ED-XRF IN EMISSIONS AND AIR QUALITY MONITORING - 1962 TO 2018 AND BEYOND

We present our key note speakers. Tune in with this brief summary of Dr. John Cooper's presentation at the upcoming 2018 Conference.

Over the last 50+ years, great strides have been made in energy dispersive X-ray fluorescence (ED-XRF) technology as applied to air quality monitoring of ambient aerosols and stack emissions.  This period covers detector sensing technologies from vacuum tubes, scintillators, and proportional counters to liquid nitrogen-cooled, lithium-drifted semi-conductor detectors to room temperature silicon drift detectors; high-volume fiber filter sampling to continuous, size-selective PTFE filter tape sampling with near real-time metals analysis; detection limits from sub-µg/m3 to sub-pg/m3; and evolution of spectral deconvolution to on-line data interpretation.

The first part of the presentation will provide a first-hand perspective of the historical evolution of ED-XRF technology as applied to air quality management, after a brief overview of ED-XRF system components for aerosol measurements. The middle part of the presentation will focus on contemporary technology and its application to both source (stack, process, fence-line emissions and fingerprints) and ambient (urban and remote) aerosol monitoring.  The last segment of this presentation will provide a view of the future from a historical perspective with a “can-do” attitude.