We present our key note speakers. Tune in with this brief summary of Dr. John Cooper's presentation at the upcoming 2018 Conference.
Over the last 50+ years, great strides have been made in energy dispersive X-ray fluorescence (ED-XRF) technology as applied to air quality monitoring of ambient aerosols and stack emissions. This period covers detector sensing technologies from vacuum tubes, scintillators, and proportional counters to liquid nitrogen-cooled, lithium-drifted semi-conductor detectors to room temperature silicon drift detectors; high-volume fiber filter sampling to continuous, size-selective PTFE filter tape sampling with near real-time metals analysis; detection limits from sub-µg/m3 to sub-pg/m3; and evolution of spectral deconvolution to on-line data interpretation.
The first part of the presentation will provide a first-hand perspective of the historical evolution of ED-XRF technology as applied to air quality management, after a brief overview of ED-XRF system components for aerosol measurements. The middle part of the presentation will focus on contemporary technology and its application to both source (stack, process, fence-line emissions and fingerprints) and ambient (urban and remote) aerosol monitoring. The last segment of this presentation will provide a view of the future from a historical perspective with a “can-do” attitude.